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Origins of domain wall pinning in ferroelectric nanocapacitors
김윤석,Han Hee,Vrejoiu Ionela,Lee Woo,Hesse Dietrich,Alexe Marin 나노기술연구협의회 2014 Nano Convergence Vol.1 No.24
We have investigated domain wall pinning and its origins in ferroelectric nanocapacitors using piezoresponse force microscopy. Domain wall pinning of two different types was observed in the nanocapacitors. The first type of pinning originates from local point defects similar to previous reports. The second one originates from immobile local defects in the place of pristine domains. In both cases, pinning and de-pinning processes were observed without significant domain wall bowing. The results can be helpful to understand domain wall motion and improve the reliability of nanoscale ferroelectric memory devices.
Nonlinear Phenomena in Multiferroic Nanocapacitors: Joule Heating and Electromechanical Effects
Kim, Yunseok,Kumar, Amit,Tselev, Alexander,Kravchenko, Ivan I.,Han, Hee,Vrejoiu, Ionela,Lee, Woo,Hesse, Dietrich,Alexe, Marin,Kalinin, Sergei V.,Jesse, Stephen American Chemical Society 2011 ACS NANO Vol.5 No.11
<P>We demonstrate an approach for probing nonlinear electromechanical responses in BiFeO<SUB>3</SUB> thin film nanocapacitors using half-harmonic band excitation piezoresponse force microscopy (PFM). Nonlinear PFM images of nanocapacitor arrays show clearly visible clusters of capacitors associated with variations of local leakage current through the BiFeO<SUB>3</SUB> film. Strain spectroscopy measurements and finite element modeling point to significance of the Joule heating and show that the thermal effects caused by the Joule heating can provide nontrivial contributions to the nonlinear electromechanical responses in ferroic nanostructures. This approach can be further extended to unambiguous mapping of electrostatic signal contributions to PFM and related techniques.</P><P><B>Graphic Abstract</B> <IMG SRC='http://pubs.acs.org/appl/literatum/publisher/achs/journals/content/ancac3/2011/ancac3.2011.5.issue-11/nn203342v/production/images/medium/nn-2011-03342v_0003.gif'></P><P><A href='http://pubs.acs.org/doi/suppl/10.1021/nn203342v'>ACS Electronic Supporting Info</A></P>