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Towards defi ning a simplifi ed procedure for COTS system-on-chip TID testing
Stefano Di Mascio,Alessandra Menicucci,Gianluca Furano,Tomasz Szewczyk,Luigi Campajola,Francesco Di Capua,Andrea Lucaroni,Marco Ottavi 한국원자력학회 2018 Nuclear Engineering and Technology Vol.50 No.8
The use of System-on-Chip (SoC) solutions in the design of on-board data handling systems is animportant step towards further miniaturization in space. However, the Total Ionizing Dose (TID) andSingle Event Effects (SEE) characterization of these complex devices present new challenges that areeither not fully addressed by current testing guidelines or may result in expensive, cumbersome testconfigurations. In this paper we report the test setups, procedures and results for TID testing of a SoCmicrocontroller both using standard 60Co and low-energy protons beams. This paper specifically pointsout the differences in the test methodology and in the challenges between TID testing with proton beamand with the conventional gamma ray irradiation. New test setup and procedures are proposed whichare capable of emulating typical mission conditions (clock, bias, software, reprogramming, etc.) whilekeeping the test setup as simple as possible at the same time.