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CHANG, C H,KOO, Y M,PADMORE, H 대한금속재료학회(대한금속학회) 1996 METALS AND MATERIALS International Vol.2 No.1
One of the principal industry standard means of measuring surface and near surface wafer contamination is the total reflection X-ray fluorescence (TXRF). A TXRF experiment using synchrotron radiation is carried out at the Advance light source (ALS) beamline 10.32 to investigate the performance of synchrotron radiation based approaches for this application. The detection limit of 49×10^9 atoms/㎠ is achievable for the 3-d elements with the present ALS TXRF beamline 10.32. This is due to the greatly improved signal to background in case of the synchrotron radiation TXRF. Furthermore, there is a path to improving the synchrotron case to reach a detection limit of 7.8×10^7 atoms/㎠.
Opachich, Y P,Comin, A,Bartelt, A F,Young, A T,Scholl, A,Feng, J,Schmalhorst, J,Shin, H J,Engelhorn, K,Risbud, S H,Reiss, G,Padmore, H A IOP Pub 2010 Journal of Physics, Condensed Matter Vol.22 No.15
<P>The demagnetization dynamics of the Heusler alloy Co<SUB>2</SUB>MnSi was studied using picosecond time-resolved x-ray magnetic circular dichroism. The sample was excited using femtosecond laser pulses. In contrast to the sub-picosecond demagnetization of the metal ferromagnet Ni, substantially slower demagnetization with a time constant of 3.5 ± 0.5 ps was measured. This could be explained by a spin-dependent band gap inhibiting the spin-flip scattering of hot electrons in Co<SUB>2</SUB>MnSi, which is predicted to be half-metallic. A universal demagnetization time constant was measured across a range of pump power levels. </P>