http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
Mixed-Domain Adaptive Blind Correction of High-Resolution Time-Interleaved ADCs
서문교,남은수,Mark Rodwell 한국전자통신연구원 2014 ETRI Journal Vol.36 No.6
Blind mismatch correction of time-interleaved analogto-digital converters (TI-ADC) is a challenging task. Wepresent a practical blind calibration technique for lowcomputation,low-complexity, and high-resolutionapplications. Its key features are: dramatically reducedcomputation; simple hardware; guaranteed parameterconvergence with an arbitrary number of TI-ADCchannels and most real-life input signals, with nobandwidth limitation; multiple Nyquist zone operation;and mixed-domain error correction. The proposedtechnique is experimentally verified by an M = 4 400MSPS TI-ADC system. In a single-tone test, the proposedpractical blind calibration technique suppressed mismatchspurs by 70 dB to 90 dB below the signal tone across thefirst two Nyquist zones (10 MHz to 390 MHz). A widebandsignal test also confirms the proposed technique.
Chen, Han-Ping,Yuan, Yu,Yu, Bo,Ahn, Jaesoo,McIntyre, Paul C.,Asbeck, Peter M.,Rodwell, Mark J. W.,Taur, Yuan IEEE 2012 IEEE transactions on electron devices Vol.59 No.9
<P>This paper presents a detailed analysis of the multifrequency capacitance–voltage and conductance–voltage data of <TEX>$\hbox{Al}_{2}\hbox{O}_{3}/\hbox{n-InGaAs}$ </TEX> MOS capacitors. It is shown that the widely varied frequency dependence of the data from depletion to inversion can be fitted to various regional equivalent circuits derived from the full interface-state model. In certain regions, incorporating bulk-oxide traps in the interface-state model enables better fitting of data. By calibrating the model with experimental data, the interface-state density and the trap time constants are extracted as functions of energy in the bandgap, from which the stretch-out of gate voltage is determined. It is concluded that the commonly observed decrease of the 1-kHz capacitance toward stronger inversion is due to the increasing time constant for traps to capture majority carriers at the inverted surface.</P>