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Jianping Zhang,Chao Liu,Guoliang Cheng,Xiao Chen,Jionglei Wu,Qunzhi Zhu,Laichang Zhang 한국정보디스플레이학회 2014 Journal of information display Vol.15 No.2
It is currently hard to estimate the reliability parameters of organic light-emitting diodes (OLEDs) when conducting a life test at normal stress, due to the remarkably improved life of OLEDs to thousands hours. This work adopted three constant-stress accelerated life tests (CSALTs) to predict the life of white OLEDs in a short time. TheWeibull function was applied to describe the life distribution, and the shape and scale parameters were estimated using the least square method. The experimental test data were statistically analyzed using a self-developed software. The life of white OLEDs predicted via this software is ingood agreement with that reported from the customers. The numerical results indicated that the assumptions of CSALT are correct, and that CSALT can be used to predict the life of white OLEDs. This work confirmed that the life of white OLEDs meets the Weibull distribution, and that the accelerated life equation conforms to the inverse power law. Furthermore, the precise accelerated parameters were shown to be particularly useful in enabling the rapid estimation of white OLEDs’ life.