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Electric Control of Friction on Silicon Studied by Atomic Force Microscope
Yan Jiang,Lili Yue,Boshen Yan,Xi Liu,Xiaofei Yang,Guoan Tai,Juan Song 성균관대학교(자연과학캠퍼스) 성균나노과학기술원 2015 NANO Vol.10 No.3
We investigated friction on an n-type silicon surface using an atomic force microscope when a bias voltage was applied to the sample. Friction forces on the same track line were measured before and after the bias voltages were applied and it was found that the friction forces in n-type silicon can be tuned reversibly with the bias voltage. The dependence of adhesion forces between the silicon nitride tip and Si sample on the bias voltages approximately follows a parabolic law due to electrostatic force, which results in a significant increase in the friction force at an applied electric field.