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    Perpendicular magnetic tunnel junctions with TbFeCo-based pinned layer and CoFeB-MgO free layer

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    https://www.riss.kr/link?id=T12706699

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    다국어 초록 (Multilingual Abstract) kakao i 다국어 번역

    We have fabricated perpendicular magnetic tunnel junctions (pMTJs) with a CoFeB/ TbFeCo pinned layer and Ta/ CoFeB/ MgO free layer using in-situ annealing process. The TbFeCo-based hybrid pinned layer is a useful approach to obtain a high perpendicular magnetic anisotropy (PMA). However, a high temperature annealing, often required for MgO-based MTJs to obtain a high tunneling magnetoresistance (TMR), may deteriorate the PMA of TbFeCo films. Our experimental results show a possibility to obtain a reasonable TMR and high PMA simultaneously by conducting an annealing process to achieve a grain-to-grain epitaxy in CoFeB/MgO/CoFeB layers before depositing the TbFeCo layer. The pMTJs prepared by this process show a tunneling magnetoresistance (TMR) ratio of 15% to 19 % at room temperature.
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    We have fabricated perpendicular magnetic tunnel junctions (pMTJs) with a CoFeB/ TbFeCo pinned layer and Ta/ CoFeB/ MgO free layer using in-situ annealing process. The TbFeCo-based hybrid pinned layer is a useful approach to obtain a high perpendicula...

    We have fabricated perpendicular magnetic tunnel junctions (pMTJs) with a CoFeB/ TbFeCo pinned layer and Ta/ CoFeB/ MgO free layer using in-situ annealing process. The TbFeCo-based hybrid pinned layer is a useful approach to obtain a high perpendicular magnetic anisotropy (PMA). However, a high temperature annealing, often required for MgO-based MTJs to obtain a high tunneling magnetoresistance (TMR), may deteriorate the PMA of TbFeCo films. Our experimental results show a possibility to obtain a reasonable TMR and high PMA simultaneously by conducting an annealing process to achieve a grain-to-grain epitaxy in CoFeB/MgO/CoFeB layers before depositing the TbFeCo layer. The pMTJs prepared by this process show a tunneling magnetoresistance (TMR) ratio of 15% to 19 % at room temperature.

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    목차 (Table of Contents)

    • Chapter 1. Introduction 1
    • Chapter 2. Theoretical Background 6
    • 2.1 Tunneling magnetoresistance (TMR) 6
    • 2.2 Magnetic tunnel junction (MTJ) 9
    • Chapter 3. Experimental Details 23
    • Chapter 1. Introduction 1
    • Chapter 2. Theoretical Background 6
    • 2.1 Tunneling magnetoresistance (TMR) 6
    • 2.2 Magnetic tunnel junction (MTJ) 9
    • Chapter 3. Experimental Details 23
    • 3.1 Film preparation 23
    • 3.2 Magnetic characterization and TMR measurements 26
    • Chapter 4. Results and discussion 27
    • 4.1 Magnetic properties of pinned layer materials 27
    • 4.2 The effect of annealing on the magnetic properties of pinned layers 30
    • 4.3 CoFeB thickness dependence of the TMR of pMTJs 34
    • Chapter 5. Conclusions 39
    • References 40
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