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(Invited) Parastic Elements in Gate Stacks and Contacts of Planar and Fin Transistors
Wachnik, R.; Lu, N.; Lee, S.; Johnson, J. B.; Li, H.; Solomon, P.; Kwon, U.; Krishnan, S. The Electrochemical Society 2014 p.3-8
Shi, X.; Yang, S. F.; Pu, Y.; Fang, L.; Wu, H.; Pan, Z.; Ding, Y. K.; Lee, B. H.; Zhang, Q. J.; Tao, J. J. The Electrochemical Society 2014 p.9-14
Deng, H.; Cai, Y.; Yu, M.; Huang, R. The Electrochemical Society 2014 p.15-20
Characterization of Single Photon Avalanche Diodes Fabricated by 0.13μm Flash Process Technology
Bu, X.; Ji, X.; Guo, J.; Feng, L.; Chen, C.; Yan, F. The Electrochemical Society 2014 p.21-26
Zhang, D.; Huo, Z.; Jin, L.; Han, Y.; Chen, G.; Chu, Y.; Li, X.; Liu, M. The Electrochemical Society 2014 p.27-32
A Compact Behavioral Simulation Model for CMOS Vertical Hall-Effect Devices
Huang, H.; Xu, Y.; Wang, D.; Wu, J.; Qin, H.; Hu, Y. The Electrochemical Society 2014 p.33-38
The Influence of Top Metal (TM) Layer Stress on Underneath Inter-Metal VBD Performance
Wang, Z. T.; Zhou, M.; Zhang, B. The Electrochemical Society 2014 p.39-44
Improved Magnetic Sensitivity of CMOS Vertical Hall Device by Using Partial Implantation Technique
Huang, H.; Xu, Y.; Wang, D.; Wu, J.; Qin, H. The Electrochemical Society 2014 p.45-50
Sun, H.; Li, Y.; Zhang, S.; Xie, X.; Cai, G.; Zhou, Z.; Shi, X.; He, Y.; Shi, W.; Ju, J. The Electrochemical Society 2014 p.51-56
Yahyazadeh, R. The Electrochemical Society 2014 p.57-62