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      KCI등재후보 SCIE SCOPUS

      Noise Analysis of Sub Quarter Micrometer AlGaN/GaN Microwave Power HEMT

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      https://www.riss.kr/link?id=A76536854

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      다국어 초록 (Multilingual Abstract)

      An analytical 2-dimensional model to explain the small signal and noise properties of an AlGaN/GaN modulation doped field effect transistor has been developed. The model is based on the solution of twodimensional Poisson’s equation. The developed mo...

      An analytical 2-dimensional model to explain the small signal and noise properties of an AlGaN/GaN modulation doped field effect transistor has been developed. The model is based on the solution of twodimensional Poisson’s equation. The developed model explains the influence of Noise in ohmic region (Johnson noise or Thermal noise) as well as in saturated region (spontaneous generation of dipole layers in the saturated region). Small signal parameters are obtained and are used to calculate the different noise parameters. All the results have been compared with the experimental data and show an excellent agreement and the validity of our model.

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      목차 (Table of Contents)

      • Abstract
      • Ⅰ. INTRODUCTION
      • Ⅱ. MODEL FORMULATION
      • Ⅲ. NOISE ANALYSIS OF AN ALGAN/GAN BASED HEMT
      • Ⅳ. RESULTS AND DISCUSSION
      • Abstract
      • Ⅰ. INTRODUCTION
      • Ⅱ. MODEL FORMULATION
      • Ⅲ. NOISE ANALYSIS OF AN ALGAN/GAN BASED HEMT
      • Ⅳ. RESULTS AND DISCUSSION
      • Ⅴ. CONCLUSIONS
      • REFERENCES
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      참고문헌 (Reference)

      1 T.M.Brookes, "The noise properties of high electron mobility transistor" ED-33 : 52-57, 1986

      2 R.A.Pucel, "Statz,Advances in electronics and electron physics" Academic 195-265, 1975

      3 Lee Sunglae, "Numerical noise model for the AlGaN/GaN HEMT" 2004

      4 H.Statz, "Noise characteristics of gallium arsenide field effect transistor" ED-21 : 549-562, 1974

      5 T.Felgentreff, "Noise Parameter Modeling of HEMTs with resistor temperature noise sources" 853-856, 1994

      6 J.C. De Jaeger, "Noise Assessment of AlGaN/GaN HEMTs on Si or SiC Substrates:Application to X-band low Noise Amplifiers" 229-, 2005

      7 Y.T. Sullivan, "Measurement of piezoelectrically induced charge in GaN/AlGaN heterostructure field effect transistor" 71 (71): 2794-2796, 1997

      8 S.S.H. Hsu, "Low noise AlGaN/GaN MODFETs with high breakdown and power characteristics" 229-232, 2001

      9 J.Deng, "Low Frequency and Microwave Noise Characteristics of GaN and GaAs-based HFETs" 2001

      10 S. Nuttinck, "Highfrequency noise in AlGaN/GaN HFETs" 13 : 149-151, 2003

      1 T.M.Brookes, "The noise properties of high electron mobility transistor" ED-33 : 52-57, 1986

      2 R.A.Pucel, "Statz,Advances in electronics and electron physics" Academic 195-265, 1975

      3 Lee Sunglae, "Numerical noise model for the AlGaN/GaN HEMT" 2004

      4 H.Statz, "Noise characteristics of gallium arsenide field effect transistor" ED-21 : 549-562, 1974

      5 T.Felgentreff, "Noise Parameter Modeling of HEMTs with resistor temperature noise sources" 853-856, 1994

      6 J.C. De Jaeger, "Noise Assessment of AlGaN/GaN HEMTs on Si or SiC Substrates:Application to X-band low Noise Amplifiers" 229-, 2005

      7 Y.T. Sullivan, "Measurement of piezoelectrically induced charge in GaN/AlGaN heterostructure field effect transistor" 71 (71): 2794-2796, 1997

      8 S.S.H. Hsu, "Low noise AlGaN/GaN MODFETs with high breakdown and power characteristics" 229-232, 2001

      9 J.Deng, "Low Frequency and Microwave Noise Characteristics of GaN and GaAs-based HFETs" 2001

      10 S. Nuttinck, "Highfrequency noise in AlGaN/GaN HFETs" 13 : 149-151, 2003

      11 M.N.Yoder, "Gallium nitride:Past,present and future" 3-12, 1997

      12 M.S.Shur, "GaN based transistors for high power applications" 42 (42): 2131-2138, 1998

      13 U. K. Mishra, "GaN based microwave power HEMT" 878-883, 1998

      14 K.Kamei, "Extremely low – noise 0.25μm gate HEMT" 541-546, 1985

      15 S. N. Mohammad, "Emerging gallium nitride based devices" 83 : 1306-1355, 1995

      16 Bernd-Ulrich H. Klepser, "Analytical Bias Dependent Noise Model for InP HEMT’s" 42 (42): 1882-1889, 1995

      17 R.K.Tyagi, "An analytical two dimensional model for AlGaN/ GaN HEMT with polarization effects for high power applications" 38 : 877-883, 2007

      18 C.S. Chang, "An analytical model for HEMT using new velocity field dependence" ED 34 : 1456-1462, 1987

      19 Wu Lu, "AlGaN/GaN HEMT on SiC with over 100 GHz ft and Low Microwave Noise" 48 (48): 581-585, 2001

      20 V.Kumar, "AlGaN/GaN HEMT in SiC with fT of over 120GHz" 23 : 455-457, 2002

      21 A.F.M. Anwar, "A noise model for high electron mobility transistors" 41 (41): 2087-2092, 1994

      22 R. K. Tyagi, "A new two-dimensional C–V model for prediction of maximum frequency of oscillation (fmax) of deep submicron AlGaN/GaN HEMT for microwave and millimeter wave applications" 39 (39): 1634-1641, 2008

      23 Hikaru Hida, "A new Low-Noise AlGaAs/GaAs 2 DEG FET with a surface undoped layer" ed-33 (ed-33): 601-607, 1986

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      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2014-01-21 학회명변경 영문명 : The Institute Of Electronics Engineers Of Korea -> The Institute of Electronics and Information Engineers KCI등재
      2010-11-25 학술지명변경 한글명 : JOURNAL OF SEMICONDUTOR TECHNOLOGY AND SCIENCE -> JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE KCI등재
      2010-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2009-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2007-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.42 0.13 0.35
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
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