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이 학술지의 논문 검색
Thirty years of silicon-on-insulators : do trends emerge?
Cullen, G. W.;Duffy, M. T.;Ipri, A. C. The Society 1994 p.5-15
Mechanisms of SIMOX synthesis and related microstructural properties
Stoemenos, J.;Aspar, B.;Margail, J. The Society 1994 p.16-27
Heavy metal gettering in SIMOX wafers
Jablonski, J.;Miyamura, Y.;Imai, M.;Tsuya, H. The Society 1994 p.28-37
Defects induced by heavy-metal on bonded SOI wafer surfaces
Okonogi, K.;Kikuchi, H.;Arai, K. The Society 1994 p.38-43
Zhang, J. P.;Hemment, P. L. F.;Newstead, S. M.;Powell, A. R. The Society 1994 p.44-49
Giles, L. F.;Meyyappan, N.;Nejim, A.;Blake, J. The Society 1994 p.50-56
Experimental study of structure formation in ion beam synthesized buried layers
Weber, R.;Skorupa, W. The Society 1994 p.57-61
Ultra thin buried oxide layers formed by low dose SIMOX processes
Aspar, B.;Pudda, C.;Papon, A. M. The Society 1994 p.62-69
Litovchenko, V. G.;Romanyuk, B. N.;Melnik, V. P.;Klyui, N. I. The Society 1994 p.70-81
Effect of implantation conditions on defect microstructure in annealed SIMOX
Lee, J. D.;Park, J. C.;Krause, S. J.;Venables, D. The Society 1994 p.82-91