다세대 내구성 소비재의 수요분석을 위한 확산모형

박세훈(Se Hoon Park) 한국경영학회 2002 經營學硏究 Vol.31 No.6

This suty deals with the dynamic sales behavior of wuccessive generations of high-technology consumer durables. Norton and Bass(1987), Nahajan and Muller(1996), and Jun and Park(1999) have proposed extensions of the Bass(1969) diffusion model to capture simultaneously the substitution and diffusion patterns for each successive generation of technological innovation. Jun and Park categorize sales data for multigenerational products based on whether the data distinguish between upgrade demand and first-purchase demand. That is. they reger to the case where the two demands are distinguishable in the sales data as Type I and to the case where they are not distinguishable as Type Il and then develop Type I and Type Ⅱ models which can be applied to data of each type. Furthermore, they assert that the models of Norton and Bass(1987) and Mahajan and Muller(1996) can only be applied to data of Type Ⅰ. but no existing model except for their Type Ⅱ model can be applied in the cas of Type Ⅱ data. In this article, Ⅰ propose a new multigeneration diffusion model that can be applied to data of Type Ⅱ. ThenⅠapply the Type Ⅱ model(JP2) of Jun and Park and the proposed model(NB2) in this study to the worldwide PC sales data(i.e. TypeⅡdata). Empirical comparison results reveal that in terms of fitting ability and predictive validity, the proposed mode(NB2) performs better than the Type Ⅱ model(JP2) of Jun and Park.

상표전환 행렬을 이용한 상표충성도와 경쟁위상 분석

박세훈(Se Hoon Park) 한국마케팅학회 2001 마케팅연구 Vol.16 No.3

본 논문에서는 Park, Jain and Krishnamurthi(1998)에서 제안된 총체적 수준의 상표전환 모형을 변형하여 도출된 본 연구에서 제시한 모형은 Colombo and Morrison(1989)이 제안한 상표전환 모형(C-M 모형)의 일반적 형태임을 보여주었고, 또한 C-M모형과는 달리 IIA특성을 내포하고 있지 않다는 것을 보여주었다. 그러므로 제품시장이 구조화되어 있는 경우에 총체적 수준의 상표전환 행렬을 사용하여 상표전환분석을 행하였을 때, 본 연구에서 제시한 모형은 C-M모형과는 상이한 비조건부 시장점유율과 충성도 지수들을 제공하고 또한 상표간 충성도 지수들의 비교·평가를 통하여 상표들 사이의 경쟁위상을 판별할 수 있다는 것을 보여 주었다. 마지막으로 냉장고시장의 상표전환 행렬을 사용하여 본 연구에서 제시한 모형과 C-M모형이 제공하는 상표전환 분석 결과와 이에 따른 마케팅 전략적 시사점들의 상이성을 예시하였다. Recently, Park, Jain and Krishnamurthi (1998) developed an aggregate-level brand switching model incorporating the hierarchical market structure and the varying degrees of (possibly negative) loyalty across all individuals in the market. This article shows that Park-Jain-Krishnamurthi (P-J-K) brand switching model is a generalized version of the Colombo-Morrison (C-M) brand switching model (Colombo and Morrison 1989). That is, the P-J-K model with hierarchically structured market condition is a form of the more general mover/stayer model while the P-J-K model with unstructured market condition is equivalent to the C-M model. The cross loyalty indices of brand i, which can be derived from the parameters of the P-J-K model, indicate the customer sources that brand i attracts. Furthermore, the difference of cross loyalty indices between brands i and j reveals the degree of competitive position of brand i relative to brand j. Knowledge of such relationships among competing brands would help brand managers in developing marketing strategies. Finally, this paper illustrates the proposed brand switching analysis with application to one durable good (i.e., refrigerator).

탄소 다배출 및 비다배출 업종 비교를 통한 국내 대기업의 ESG 활동 동형화 현상 연구

박세훈,류찬하,박세진,천동필,Se Hoon Park,Chan Ha Ryu,Se Jin Park,Dong Pil Chun 한국시스템엔지니어링학회 2023 시스템엔지니어링학술지 Vol.19 No.2

This study aimed to examine the characteristics of ESG activities among major domestic companies in the carbon-emitting industry compared to industries with lower emissions, as ESG has emerged as a significant agenda across various industries. Departing from the traditional focus on the "why" of ESG, which primarily centers around financial performance, this research sought to uncover the "how" of effective ESG management in domestic companies. The analysis involved studying the sustainability reports of 124 companies using the Global Reporting Initiative (GRI) indicators and comparing high-emitting and non-high-emitting industries. The findings revealed industry-specific patterns in companies' ESG activities, providing valuable insights for future ESG evaluations and assessments. Furthermore, the advancement of rating analysis methods holds implications for ESG rating agencies and financial authorities in terms of policy-making.

백내장수술 후 단안 삼중복시가 소실된 환자의 웨이브프론트 분석 2예

박세훈,서해원,최석규,김진형,이도형.Se Hoon Park. MD. Hae Won Seo. MD. Suk Kyue Choi. MD. Jin Hyoung Kim. MD. Do Hyung Lee. MD. PhD 대한안과학회 2010 대한안과학회지 Vol.51 No.7

Purpose: To report wavefront analysis of successful treatment of monocular triplopia after cataract extraction. Case summary: (Case 1) A 59-year-old man visited our clinic for a monocular triplopia in his left eye of five years in duration. The best spectacle-corrected visual acuity (BSCVA) was 1.0 in the left eye, and the patient had a mild cortical cataract. The ocular spherical aberration (0.126 μm for the 4-mm pupil, 0.351 μm for the 6-mm pupil) measured by a Hartmann-Shack aberrometer increased preoperatively, while the corneal spherical aberration was normal. After cataract surgery, the monocular triplopia disappeared, and the ocular spherical aberration decreased. (Case 2) A 38-year-old man visited our clinic for a monocular triplopia in his left eye of a two-year duration. The best spectacle-corrected visual acuity (BSCVA) was 0.3 in the left eye, and the patient had a mild nuclear cataract. The ocular spherical aberration (-0.356 μm, -1.343 μm) and trefoil aberration (0.199 μm, 0.252 μm) increased preoperatively, while the corneal spherical and trefoil aberrations were normal. After cataract surgery, the monocular triplopia disappeared and the ocular spherical and trefoil aberrations decreased.

WiFi용 스위치 칩 내장형 기판 기술에 관한 연구

박세훈,유종인,김준철,윤제현,강남기,박종철,Park, Se-Hoon,Ryu, Jong-In,Kim, Jun-Chul,Youn, Je-Hyun,Kang, Nam-Kee,Park, Jong-Chul 한국마이크로전자및패키징학회 2008 마이크로전자 및 패키징학회지 Vol.15 No.3

본 연구에서는 상용화된 2.4 GHz 영역대에서 사용되어지는 WiFi용 DPDT(Double Pole Double throw) switch 칩을 laser 비아 가공과 도금 공정을 이용하여 폴리머 기판내에 내장시켜 그 특성을 분석하였으며 통상적으로 실장되는 wire 본딩방식으로 패키징된 기판과 특성차이를 분석 비교하였다. 폴리머는 FR4기판과 아지노 모토사의 ABF(Ajinomoto build up film)를 이용하여 패턴도금법으로 회로를 형성하였다. ABF공정의 최적화를 위해 폴리머의 경화정토를 DSC (Differenntial Scanning Calorimetry) 및 SEM (Scanning Electron microscope)으로 분석하여 경화도에 따라 도금된 구리패턴과의 접착력을 평가하였다. ABF의 가경화도가 $80\sim90%$일 경우 구리층과 최적의 접착강도를 보였으며 진공 열압착공정을 통해 기공(void)없이 칩을 내장할 수 있었다. 내장된 기관과 와이어 본딩된 기판의 측정은 S 파라미터를 이용하여 삽입손실과 반사손실을 비교 분석하였으며 그 결과 삽입손실은 두 경우 유사하게 나타났지만 반사손실의 경우 칩이 내장된 경우 6 GHz 까지 -25 dB 이하로 안정적으로 나오는 것을 확인할 수 있었다. In this study, we fabricated embedded IC (Double Pole Double throw switch chip) polymer substrate and evaluate it for 2.4 GHz WiFi application. The switch chips were laminated using FR4 and ABF(Ajinomoto build up film) as dielectric layer. The embedded DPDT chip substrate were interconnected by laser via and Cu pattern plating process. DSC(Differenntial Scanning Calorimetry) analysis and SEM image was employed to calculate the amount of curing and examine surface roughness for optimization of chip embedding process. ABF showed maximum peel strength with Cu layer when the procuring was $80\sim90%$ completed and DPDT chip was laminated in a polymer substrate without void. An embedded chip substrate and wire-bonded chip on substrate were designed and fabricated. The characteristics of two modules were measured by s-parameters (S11; return loss and S21; insertion loss). Insertion loss is less than 0.55 dB in two presented embedded chip board and wire-bonded chip board. Return loss of an embedded chip board is better than 25 dB up to 6 GHz frequency range, whereas return loss of wire-bonding chip board is worse than 20 dB above 2.4 GHz frequency.

MOSFET의 1/f noise에 의한 CMOS Ring Oscillator의 Jitter 분석

박세훈,Park Se-Hoon 한국정보통신학회 2004 한국정보통신학회논문지 Vol.8 No.8

MOSFET의 1/f 잡음은 개별 Random Telegraph Signal(RTS)의 중첩에 의해 생성되는 것으로 알려져 있다. 본 연구는 CMOS 링발진기 노드에 병렬로 RTS 전류원을 연결하여 1/f 잡음에 의한 Jitter를 분석하였다. RTS의 진폭 변화에 따른 Jitter 및 Jitter Ratio의 변화를 조사하여 RTS 진폭과 Jitter 및 Jitter Ratio의 크기가 선형적으로 비례함을 밝혔고, 링발진기의 출력 FFT를 분석하여 Jitter의 원인이 높은 차수의 고주파 위상잡음에 있음을 밝혔다. It has been known that 1/f noise of MOSFET is generated by the superposition of single random telelgraph signals (RTS). In this study, jitters caused by 1/f noise of MOSFET are analysed with RTS supplied to all of the nodes of the CMOS ring oscillator under investigation. Through the analysis of the variations of jitters and jitter ratios with varying values of the amplitude of RTS, it is found that the jitters and the jitter ratios are proportional to the amplitude of RTS. And the analysis of FFT of the outputs of the ring oscillator reveals that the jitters are closely related to the phase noise of the high order harmonics of the ring oscillator outputs.

정상안과 펨토초레이저 라식수술안에서 서로 다른 4가지 각막두께 측정계들의 중심각막두께 비교

박세훈,최석규,이도형,김진형,Se Hoon Park,MD,Suk Kyue Choi,MD,Do Hyung Lee,MD,PhD,Jin Hyoung Kim,MD 대한안과학회 2010 대한안과학회지 Vol.51 No.3

Purpose: To compare corneal pachymetry assessment using four measurement methods in normal and post-femtosecond laserassisted LASIK eyes. Methods: Central corneal thickness was measured sequentially using Orbscan II, Pentacam, Galilei and ultrasonic pachymetry in 30 normal, non-surgical eyes (Group I), 30 eyes one to six months after femtosecond laser-assisted LASIK (Group II), and 30 eyes six months or longer after femtosecond laser-assisted LASIK (Group III). Results: In Group I, corneal thickness measurements were similar for all four methods (P=0.202, one way ANOVA). In Groups II and III, corneal thickness measurements were significantly different (P=0.000, respectively, one way ANOVA). Compared to the Pentacam, Galilei and ultrasonic pachymetry, Orbscan significantly underestimated the corneal thicknesses in Groups II and III (P<0.005, respectively, one way ANOVA). Conclusions: Central corneal thicknesses of normal eyes were similar for all four measurements, therefore corneal thickness measurements before refractive surgery using all four measurements is suitable. However measurements obtained with the Orbscan II were thinner than those obtained with the Pentacam, Galilei or ultrasonic pachymetry in post femtosecond laserassisted LASIK eyes. Further studies are needed to determine which instrument is more accurate in measuring central corneal thickness before and after refractive surgery. J Korean Ophthalmol Soc 2010;51(3):320-327

PCB내 1005 수동소자 내장을 이용한 Diplexer 구현 및 특성 평가

박세훈,윤제현,유찬세,김필상,강남기,박종철,이우성,Park, Se-Hoon,Youn, Je-Hyun,Yoo, Chan-Sei,Kim, Pil-Sang,Kang, Nam-Kee,Park, Jong-Chul,Lee, Woo-Sung 한국마이크로전자및패키징학회 2007 마이크로전자 및 패키징학회지 Vol.14 No.2

현재 PCB기판내에 소재나 칩부품을 이용하여 커패시터나 저항을 구현하여 내장시키는 임베디드 패시브기술에 대한 연구가 많이 진행되어 지고 있다. 본 연구에서는 커패시터 용량이나 인덕터의 특성이 검증된 칩부품을 기판내 내장시켜 다이플렉서 기판을 제작하였다. $880\;MHz{\sim}960\;MHz(GSM)$영역과 $1.71\;GHz{\sim}1.88\;GHz(DCS)$영역을 나누는 회로를 구성하기 위해 1005크기의 6개 칩을 표면실장 공정과 함몰공정으로 형성시켜 Network Analyzer로 측정하여 비교하였다. chip표면실장으로 구현된 Diplexer는 GSM에서 최대 0.86 dB의 loss, DCS에서 최대 0.68 dB의 loss가 나타났다. 표면실장과 비교하였을 때 함몰공정의 Diplexer는 GSM 대역에서 약 5 dB의 추가 loss가 나타났으며 목표대역에서 0.6 GHz정도 내려갔다. 칩 전극과 기판의 도금 연결부위는 $260^{\circ}C$, 80분의 고온공정 및 $280^{\circ}C$, 10초의 솔더딥핑의 열충격 고온공정에서도 이상이 없었으며 특성의 변화도 거의 관찰되지 않았다. Today lots of investigations on Embedded Passive Technology using materials and chip components have been carried out. We fabricated diplexers with 1005 sized-passives, which were made by burying chips in PCB substrate and surface mounting chip on PCB. 6 passive chips (inductors and capacitors) were used for the frequency divisions of $880\;MHz{\sim}960\;MHz(GSM)$ and $1.71\;GHz{\sim}1.88\;GHz(DCS)$. Two types of diplxer were characterized with Network analyzer. The chip buried diplexer showed extra 5db loss and a little deviation of 0.6GHz at aimed frequency areas, whereas the chip mounted diplexer showed man. 0.86dB loss within GSM field and max. 0.68dB within DCS field respectively. But few degradations were observed after $260^{\circ}C$ for 80min baking and $280^{\circ}C$ for 10sec solder floating.

안내후방콘택트렌즈 삽입술 후 고위수차의 변화

박세훈,염정훈,최석규,이종현,김진형,이도형,김태진.Se Hoon Park. MD. Jung Hoon Yum. MD. Suk Kyue Choi. MD. Jong Hyun Lee. MD. Jin Hyoung Kim. MD. Do Hyung Lee. MD. PhD. Tae Jin Kim. MD 대한안과학회 2010 대한안과학회지 Vol.51 No.9

Purpose: To evaluate the changes in higher-order aberrations (HOAs) after implantation of an ICL (implantable contact lens). Methods: Twenty-six eyes that had undergone ICL implantation between February 2008 and October 2009 were included. Ocular higher-order aberrations of all the eyes were measured using the Hartmann-Shack aberrometer (KR9000PW). Examinations were performed preoperatively, as well as one week, one month, and three months after ICL implantation. Changes in ocular total higher-order aberrations, total spherical aberration, coma aberration, trefoil aberration, and S3 and S4 calculated in the central 4-mm zone and expressed as root mean square (RMS) values were analyzed. Results: The mean patient age was 25.4 years, and the mean preoperative spherical equivalent was -6.40 diopters(D). The mean postoperative spherical equivalents were 0.00 ± 0.13D, 0.03 ± 0.21D, -0.013 ± 0.12D at one week, one month, and three months, respectively. There were no statistically significant differences in ocular higher-order aberration RMS, including spherical, coma, or trefoil aberration, at one week, one month, or three months postoperative or between preoperative and postoperative measurements. Conclusions: There is no significant change of ocular higher order aberration in the central 4-mm zone after ICL implantation. J Korean Ophthalmol Soc 2010;51(9):1210-1216

CMOS 링발진기의 전원 잡음에 의한 위상잡음과 Jitter 연구

박세훈,Park Se-Hoon 한국정보통신학회 2006 한국정보통신학회논문지 Vol.10 No.2

전원 잡음에 의한 링발진기의 위상잡음과 jitter의 모델을 제시하고 시뮬레이션을 수행하여 모델의 타당성을 확인하였다. 링발진기의 전원 잡음은 협대역 위상변조에 의해 중심 주파수 양측면에 잡음 주파수만큼 간격을 두고 출력 잡음 신호가 나타나는 위상잡음으로 나타났다. 또한 전원 잡음에 의한 jitter의 선형 모델을 제시하였고, 시뮬레이션에 의해 jitter가 잡음 진폭의 크기에 비례하여 발생하는 것을 확인하였다. Models for the phase noise and jitter of the ring oscillator with the power supply noise are suggested and verified by simulations. The power supply noise is converted into the phase-noise by the narrow band phase modulation. The phase-noise appears as sideband frequencies apart from the center frequency of the ring oscillator as much as the frequency of the power supply noise. A jitter model describing the linear relation of jitter with the amplitude of the power supply noise is suggested and verified by simulation.