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      • 집열기 배관의 비정상열손실에 관한 연구

        변장환,배석태,김시범 동아대학교 공과대학 부설 한국자원개발연구소 1992 硏究報告 Vol.16 No.2

        In the metal pipe covered with insulation material, a study was made for the influences of heat capacity of pope, heat capacity of insulation material and insulation thickness on the transient heat loss. Also, approximate analysis which considered the system lumped heat capacity system was performed. As the heat capacity of pope, heat capacity of insulation material and insulation thickness increase, transient heat loss increases linearly. In case that the heat capacity of the pope much larger than that the insulation material, the results of the approximate analysis showed a good agreement with those of the numerical analysis.

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        전기화학적 방법에 의한 주조 스테인리스강 CF8M $\sigma$상 열화평가

        권재도,김중형,박중철,변장환,이우호,Gwon, Jae-Do,Kim, Jung-Hyeong,Park, Jung-Cheol,Byeon, Jang-Hwan,Lee, U-Ho 대한기계학회 1999 大韓機械學會論文集A Vol.23 No.11

        The present investigation is concerned with the degradation characteristics of cast stainless steel(CF8M), exposed to the $\sigma$-phase degradation at $700^{\circ}C$. In the present paper, the degradation of CF8 M at $700^{\circ}C$ is evaluated by a non-destructive test, DL-EPR(double loop electrochemical potentiokinetic reactivation). The surface of specimens is observed by using scanning electron microscopy after DL-EPR test. Also. chromium contents of matrix, grain boundary and ferrite phase are analyzed by electron probe X-ray micro analyzer. Through the experiments, the following results are obtained 1) The degree of sensitization(DOS) of CF8M aged up to 15hr at $700^{\circ}C$ is increased with acing time while that is decreased with aging time from 15hr to 150hr. 2) The impact energy decreases with increase of $\sigma$-phase while DOS increases with $\sigma$-phase until aging time reaches to 15hr. After the aging time. 15hr, the $\sigma$-phase and the rate of impact energy with respect to aging time decreases. Therefore the degradation behavior of the CF8M can be evaluated by comparing SEM micrographs and the value of DOS.

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