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수로측량정보의 e-Navigation 서비스 다목적 활용방안
권광석,허천우 한국항해항만학회 2017 한국항해항만학회 학술대회논문집 Vol.2017 No.추계
선박의 대형화, 해상물류 생산성 및 환경보존의 중요성이 증대함에 따라 다양한 부문에서 eNavigation 서비스가 요구되고 있으며 변화하는 기술환경이 고려되어야 한다. 항해안전과 효율성, 환경 등 다양한 수요를 고려하여 신뢰할 수 있는 최신 수로측량정보를 확보해야 한다. 본 연구에서는 다양한 목적에 효과적인 eNavigation 서비스가 제공될 수 있도록 수로측량정보 활용방안을 제시하고자 한다.
평면모델 기반 수중 비디오 모자익 제작에 관한 연구 방안
권광석(Kwang-Seok Kwon),우희숙(Hee-Sook Woo),강진아(Jin-A Kang) 한국마린엔지니어링학회 2009 한국마린엔지니어링학회 학술대회 논문집 Vol.2009 No.-
In this paper, it was outlined a methodology to reconstruct three dimensional planes from underwater-video frames with positions, attitudes and altitudes of an underwater camera at same times. To reconstruct target planes, there are some assumptions that camera is aligned to the flat seafloor and imageries are obtained with slant view to the bottom. In these conditions, digital photogrammetry and GPU(Graphic Processing Unit) based parallel processing methodology help us to get more quickly underwater-video mosaic imagery with reconstruction of three dimensional surface. This proposed method let us to get position, distance and area in video frames with flat surface model based reconstructions. It is expected that more quantitative and transcendental informations in underwater will be provided by combining digital photogrammetry with recent IT technologies.
널포인트 주사탐침열현미경을 이용한 SOI 기판위의 전기적으로 가열된 나노 히터 주변 온도분포 정량적 계측
황광석(Gwangseok Hwnag),진재식(Jae Sik Jin),권오명(Ohmyung Kwon) 대한기계학회 2013 대한기계학회 춘추학술대회 Vol.2013 No.12
As the gate length of field-effect transistors (FETs) has been scaled down below 50 nm, the characterization of selfheating problems becomes a great challenge. Due to the lack of quantitative measurement technique at nanoscale, the estimation of hot spot behavior in FETs mostly relies on model based on the Boltzmann transport equation (BTE). However, significant inconsistencies are founded in the estimated temperatures of the hot spot due to the different approximations adopted in the BTE models. Herein, we investigate the behavior and temperature of the hot spot by profiling the temperature distribution across the electrically heated nano-heater patterned on the Silicon-On-Insulator with the null point scanning thermal microscopy, which can quantitatively measure the temperature profile with nanoscale resolution. By comparing the experimentally obtained temperature profile with modeled one with BTE, we can provide the standard approximation for the optimized thermal design of nano-electronic devices.