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Miura, Tsutomu,Matsue, Hideaki Korean Nuclear Society 2016 Nuclear Engineering and Technology Vol.48 No.2
Prompt gamma activation analysis using a thermal neutron-guided beam at Japan Atomic Energy Agency JRR-3M was applied for the precise determination of Si in silicon nitride ceramic reference materials [Japan Ceramic Reference Material (JCRM) R 003]. In this study, the standard addition method coupled with internal standard was used for the nondestructive determination of Si in the sample. Cadmium was used as internal standard to obtain the linear calibration curves and to compensate for the neutron beam variability. The analytical result of determining Si in JCRM R 003 silicon nitride fine powder ceramic reference materials using prompt gamma activation analysis was in good agreement with that obtained by classical gravimetric analysis. The relative expanded measurement uncertainty (k = 2) associated with the determined value was 2.4%.
A Facile Method for Patterned Growth of ZnO Nanowires Using a Black Ink
Sang Hyun Lee,Hyun Jung Lee,Hitoshi Shiku,Takafumi Yao,Tomokazu Matsue 대한금속·재료학회 2012 ELECTRONIC MATERIALS LETTERS Vol.8 No.5
Herein we present a simple route to grow patterned ZnO nanowires on various substrates using black ink. Without any metal catalysts or templates, the nanowires are selectively grown on the ink covered surface of the substrate by a chemical vapor transport and condensation method. The crystal and optical properties of the nanowires are dependent on the substrate materials. Dot patterned ZnO nanowires grown on Si substrate are demonstrated as a template for the enzyme immunoassay. This facile method for growth and patterning of inorganic nanostructures would be beneficial for easy and low-cost fabrication of micro and nano electronic,optoelectronic devices and sensors.