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Processing, dielectric behavior and conductivity of some complex tungsten-bronze dielectric ceramics
Sukhleen Bindra Narang,Dalveer Kaur,Kulwant S. Thind 한양대학교 세라믹연구소 2006 Journal of Ceramic Processing Research Vol.7 No.1
Ceramic samples of a complex structural formula Ba6-3xR8+2xTi18O54, where R is a rare-earth oxide and R=Sm, Nd and Gd and x=0.2-0.7 were prepared by a high temperature solid-state reaction technique. The dielectric properties (i.e. dielectric constant (ε'), dielectric loss (ε'') and Q-factor) have been measured on the sintered disks with respect to the frequency in the range 0.3 GHz-3.0 GHz at room temperature. The dielectric properties of the synthesized samples have been found out to be a function of the wt.% of rare-earth oxides used. Dielectric conductivity (σ) was derived from the dielectric constant and loss tangent data in the same frequency range. Conductivity calculations were carried out based on this derived formula. The capacitance values have been calculated knowing the geometrical dimensions of the samples synthesized.
Structural and microwave dielectric properties of Ba6-3xGd8+2xTi18O54 solid-solutions
S.Bindra Narang,Dalveer Kaur,Kulwant Singh Thind 한양대학교 세라믹연구소 2009 Journal of Ceramic Processing Research Vol.10 No.5
Ba6-3xGd8+2xTi18O54 (x = 0.0, 0.2 ≤ x ≤ 0.7) composites have been synthesized by employing a solid-state reactive sintering technique and studied from the point of view of microwave dielectric materials. In this series, formation of solid solutions was found, which was deduced from the linear change of the lattice parameters of the unit cells. Unit-cell parameters (Å) have been obtained with the help of the X-Ray powder diffraction (XRD) technique. Multi-phase microstructures have been observed for all the compositions using Scanning electron microscopy (SEM). We found good quality microwave materials which show a high dielectric constant (ε') of 70 and a low loss tangent (tanδ) of 0.006336 at 3 GHz. A minimum value of the A.C. dielectric conductivity (σa.c.) was 2.32E-12 mho/cm at 0.8 GHz. Ba6-3xGd8+2xTi18O54 (x = 0.0, 0.2 ≤ x ≤ 0.7) composites have been synthesized by employing a solid-state reactive sintering technique and studied from the point of view of microwave dielectric materials. In this series, formation of solid solutions was found, which was deduced from the linear change of the lattice parameters of the unit cells. Unit-cell parameters (Å) have been obtained with the help of the X-Ray powder diffraction (XRD) technique. Multi-phase microstructures have been observed for all the compositions using Scanning electron microscopy (SEM). We found good quality microwave materials which show a high dielectric constant (ε') of 70 and a low loss tangent (tanδ) of 0.006336 at 3 GHz. A minimum value of the A.C. dielectric conductivity (σa.c.) was 2.32E-12 mho/cm at 0.8 GHz.
Synthesis and microwave characterization of Bi- substituted barium lanthanum titanate
S. Bindra Narang,Shalini Bahel,Dalveer Kaur 한양대학교 세라믹연구소 2007 Journal of Ceramic Processing Research Vol.8 No.5
Bi-substituted barium lanthanum titanates with the general formula Ba4(La(1-z)Biz)9.33Ti18O54 where z = 0.0 to 0.2 in steps of 0.05 were synthesized by a conventional mixed oxide route. The composition and morphology were determined using scanning electron microscopy (SEM) and X-ray powder diffraction analysis (XRD). Two dielectric performance parameters, namely dielectric constant and loss tangent were measured with varying microwave frequency in the range 0.3 to 3 GHz at room temperature. It was observed that the dielectric constant and loss tangent both increased initially for z ≤ 0.10 and then decreased. The best properties were obtained for z = 0.20 with a dielectric constant of 91.4 and loss tangent of 0.004. This could be a promising microwave material with a high dielectric constant and low loss. Bi-substituted barium lanthanum titanates with the general formula Ba4(La(1-z)Biz)9.33Ti18O54 where z = 0.0 to 0.2 in steps of 0.05 were synthesized by a conventional mixed oxide route. The composition and morphology were determined using scanning electron microscopy (SEM) and X-ray powder diffraction analysis (XRD). Two dielectric performance parameters, namely dielectric constant and loss tangent were measured with varying microwave frequency in the range 0.3 to 3 GHz at room temperature. It was observed that the dielectric constant and loss tangent both increased initially for z ≤ 0.10 and then decreased. The best properties were obtained for z = 0.20 with a dielectric constant of 91.4 and loss tangent of 0.004. This could be a promising microwave material with a high dielectric constant and low loss.