http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
- 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
- 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
RISS 인기검색어
- 검색키워드
- 저자 : 윤태진(Yun Tai Jin) (검색결과 1 건)
- 무료
- 기관 내 무료
- 유료
-
IEEE 1149.1 을 이용한 확장된 스캔 경로 구조
손우정(Son Woo Jung),윤태진(Yun Tai Jin),안광선(Ahn Gwang Seon) 한국정보처리학회 1996 정보처리학회논문지 Vol.3 No.7
In this paper, we propose a ESP(Extended Scan Path) architecture for multi-board testing. The conventional architectures for board testing are single scan path and multi-scan path. In the single scan path architecture, the scan path for test data is just one chain. If the scan path is faulty due to short or open, the test data is not valid. In the multi-scan path architecture, there ar additional singles in multi-board testing. So conventional architectures are not adopted to multi-board testing. In the case of the ESP architecture, even though scan path is either short or open, it doesn''t affect remaining other scan paths. as a result of executing parallel BIST and IEEE 1149.1 boundary scan path architecture. Because the ESP architecture uses the common bus, there are not additional signals in multi-board testing. By comparing the ESP architecture with conventional one using ISCAS''85 benchmark circuit, we showed that the architecture has improved results.
ScienceON
KISS연관 검색어 추천
이 검색어로 많이 본 자료
활용도 높은 자료
