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        Genetic dissection of grain yield traits in a large collection of spring wheat (Triticum aestivum L.) germplasm

        Khan Sultan Habibullah,Sajjad Muhammad,Gulnaz Saima,Waqar Sundas,Shahzad Munawar,Arain Saima Mir 한국작물학회 2022 Journal of crop science and biotechnology Vol.25 No.2

        Understanding genetic architecture of a crop germplasm is necessary for designing a successful breeding program. Herein, we evaluated a large collection of 500 spring wheat accessions for 2 crop seasons to dissect the genetics of 11 yield components and their direct and indirect contributions to grain yield (GY). The genetic estimates of broad sense heritability (h2 ), genetic advance (GA), phenotypic correlation (rp), genotypic correlation (rg), and path coefcient analysis were performed. Signifcant genetic variation was observed for all yield traits suggesting that GY can be improved by exploiting the studied yield traits. Phenotypic coefcient of variation (Vp) was greater than genotypic coefcient of variation (Vg) for all studied traits. Higher broad sense h2 and GA were observed for grains per plant (GpP), spikes per plant (SpP), spikelets per spike (Spt/S) and grain yield (GY). The GY exhibited signifcant and positive correlation with all studied traits except with spikelet density (SptD). The GpP and TGW exhibited positive direct efect on increasing grain yield. Taking together, SpP, GpS, TGW and SDW are the major contributors to improving genetic yield potential of bread wheat with spring growth habit. The negative correlation between GY and SptD was dissected in path coefcient analysis as negative indirect efect of SptD on GY through reduced GpS and TGW. Our study provides new insights on the association of GpP, TGW and SDW in bread wheat. The GpP, TGW and SDW are infuenced by SpP, Gpt/S, G/Spt, SptD, AL and PH with indirect efects on GY. To improve yield potential in wheat, the traits with direct efects (GpP, TGW and SDW) and indirect efects (e.g., SptD) can be used as selection criteria.

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