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      • Current Sharing Behavior of Parallel Connected Silicon Carbide MOSFETs Influenced by Parasitic Inductance

        Sibao Ding,Panbao Wang,Wei Wang,Dianguo Xu,Frede Blaabjerg 전력전자학회 2019 ICPE(ISPE)논문집 Vol.2019 No.5

        The parasitic inductance from the wirings and the terminals of SiC MOSFETs has a significant impact on the behavior of current sharing of parallel-connected SiC MOSFETs. To investigate the mechanism of current mismatch in response to the parasitic inductance, the circuit model of parallel-connected SiC MOSFETs is built to obtain the mathematic relationship between current difference and parasitic inductance in both dynamic and static states. Because the way of connecting the parallel-connected SiC MOSFETs with the coupled inductor in series can lead to the turn-off voltage ringing and overshoot, an improved structure is further proposed in this paper. A RCD snubber circuit is added into the proposed structure by referring to the coupled inductor with transformer in fly-back converter. Finally, the approach is verified through the LTspice software and experiments.

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