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MORPHOLOGY CONTROL OF CARBON NANOTUBES THROUGH FOCUSED ION BEAMS
M. LOYA,J. E. PARK,L. H. CHEN,K. S. BRAMMER,P. R. BANDARU,S. JIN 성균관대학교(자연과학캠퍼스) 성균나노과학기술원 2008 NANO Vol.3 No.6
This research demonstrates the capability of controlled, focused ion beam (FIB)–assisted tailoring of morphologies in both multiwall carbon nanotubes (CNTs) and Y junction nonlinear CNT systems through defect engineering. We have shown that a 30 keV FIB Ga+ ion beam at low ion milling currents of 1 pA can be used to partially reduce the CNT diameter, to provide electrical conduction bottleneck morphologies for linear CNTs, and to introduce both additive and subractive defects at Y junction locations of Y-CNT samples. Our aim is for this work to provide motivation for additional research to determine the effects of ion-beam-induced changes in modulating the physical and chemical properties of nanotubes.