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Henry Guldner,Andreas Thiede,Hans-Joachim Schulze,Jakob Sigg,Johann Otto,Lutz Goehler,Dieter Metzner 전력전자학회 1998 ICPE(ISPE)논문집 Vol.- No.-
This paper describes the main features of an unconventional tester for high power semiconductor devices. Two application ranges are highlighted. The tester is used for the extraction of GTO parameters and their verification by measurements. The second field comprises the determination of the radial and azimuthal current density distribution of a GTO tablet. The results are compared with the carrier lifetime distribution.<br/>