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- 저자 : Binxia Du (검색결과 2 건)
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Gun Li,Binxia Du,Yong Cao,Feijiang Huang 보안공학연구지원센터 2015 International Journal of Grid and Distributed Comp Vol.8 No.2
In response to the influence of calibration parameter on measurement accuracy of characteristic impedance tester, the paper comes up with a perfect calibration method of two points based on waveform average and the optimal measuring region. The method is based on calibration method of two points. First, waveform average can reduce random errors in the testing process of characteristic impedance tester. Second, automatically selection for the optimal measuring region can reach a high precision. Last, each tube has a separate calibration parameter, increasing its consistency and Independence, which implement highly calibration for the tester. Making an integrated comparison of testing results among three algorithms, including Tektronix instrument and original method of two-point calibration, validates the accuracy of new algorithm. The method was put into the design of characteristic impedance tester using advanced measurement accuracy.
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Measurement Algorithm of Clock Jitter Based on Sequential Equivalent Sampling
Feijiang Huang,Binxia Du,Yong Cao,Gun Li 보안공학연구지원센터 2015 International Journal of Multimedia and Ubiquitous Vol.10 No.5
For the problem that general characteristic impedance measurement instrument is difficult to measure the size of clock jitter, this paper proposes a measurement algorithm to achieve clock jitter based on sequential equivalent sampling. First, according to the relationship between the equivalent sampling signal and the average signal, we count up the probability density distribution of the clock jitter and use the Tailfit jitter separation techniques to decompose total jitter (TJ) into deterministic jitter (DJ) and random jitter (RJ), then count up the peak-to-peak values of periodic jitter (PJ), cycle-to-cycle jitter (CCJ) and time interval error (TIE) to achieve a precise measurement of clock jitter. Finally we use the test results of jitter analysis software of Tektronix’s TDSJIT3 as a reference to verify the effectiveness of the algorithm. This algorithm provides quantitative analysis means for the stability of characteristic impedance measurement instrument, and provides the reference basis for self-calibration circuit design of subsequent hardware.
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