Micro-LED displays have attracted considerable attention for advanced display applications owing to their high brightness, fast response time, low power consumption, and excellent reliability[1]-[3].
However, conventional micro-LED display fabricat...
Micro-LED displays have attracted considerable attention for advanced display applications owing to their high brightness, fast response time, low power consumption, and excellent reliability[1]-[3].
However, conventional micro-LED display fabrication relies on the separate fabrication of a micro-LED frontplane and a driving backplane, followed by transfer and bonding processes. As the pixel pitch decreases, securing sufficient alignment margin, transfer yield, and bonding reliability becomes increasingly challenging[4],[5].
To mitigate these limitations, this study proposes a monolithic integration(MI) device structure in which an oxide thin-film transistor(TFT) is stacked directly on a micro-LED. To select a suitable driving TFT, AZO and IGZO TFTs were compared in terms of electrical characteristics and process compatibility. AZO TFTs exhibited relatively high drain current but could not be properly turned off by the gate bias and showed insufficient compatibility with the photolithography process. In contrast, optimized IGZO TFTs exhibited low off-current, clear switching behavior, a maximum field-effect mobility of 22.81 cm2/V·s, and an on/off current ratio on the order of 106. Based on these results, IGZO was selected as the oxide TFT active layer for micro-LED driving.
An MI device in which a micro-LED and an IGZO TFT were monolithically integrated was subsequently fabricated on a GaN-based LED epitaxial substrate. The fabricated device demonstrated that both the driving current and emission intensity of the micro-LED could be controlled by the gate bias applied to the IGZO TFT. These results confirmed that the IGZO TFT could serve as the driving device within the monolithically integrated structure.
As a subsequent strategy for extending the MI device toward a backplane-integrated display architecture, hybrid 3D integration was proposed. In this approach, the MI device, in which a micro-LED and an IGZO TFT are monolithically integrated, is bonded and vertically interconnected with a backplane pixel circuit to form a 2T1C pixel architecture. The electrical operation of the MI device fabricated on a GaN-on-Si(111) wafer, the formation of an anchor- and tether-supported suspended structure through anisotropic undercut etching of the Si(111) substrate, and the subsequent assembly process were experimentally investigated to evaluate the feasibility of the key unit processes required for the proposed integration approach.
This study presents a sequential integration strategy that extends the monolithic integration of a micro-LED and an IGZO TFT to a hybrid 3D pixel architecture incorporating a backplane pixel circuit. The proposed approach establishes a process framework for high-resolution, full- color micro-LED displays and free-form displays requiring integration on diverse substrate platforms.