Steep-slope switching that overcomes the 60 mV/dec subthreshold swing limit of conventional metal-oxidesemiconductor field-effect-transistors (MOSFETs) has attracted significant attention as a key technology for low-power electronic devices. Tunne...
Steep-slope switching that overcomes the 60 mV/dec subthreshold swing limit of conventional metal-oxidesemiconductor field-effect-transistors (MOSFETs) has attracted significant attention as a key technology for low-power electronic devices. Tunnel field-effect transistors (TFETs) are representative steep-slope device candidates because they control carrier injections based on band-to-band tunneling (BTBT), enabling switching below 60 mV/dec. In this study, we demonstrate a pInP/n-MoS₂ vertical heterojunction TFET based on n-type MoS₂ and p-type InP. The fabricated device exhibits rectifying output characteristics and a sharp increase in reverse current near VD = - 0.8 V. This behavior is more consistent with Zener tunneling or BTBT than avalanche breakdown. Under reverse-bias operation, the device shows a minimum subthreshold swing (SS) of approximately 15.3 mV/dec and an ION/IOFF of approximately 106 . Temperaturedependent measurements further support BTBT contribution in the steep-switching regime and suggest that trap-assisted tunneling (TAT) may also be involved depending on the gate bias. These results suggest that the p-InP/n-MoS₂ vertical heterojunction is a promising 2D TMD/III–V tunneling platform for low-power steepslope electronic devices.