The passive film is a key protective barrier that suppresses localized corrosion of metals, and its stability is governed by charge transport characteristics, structural composition, and point defect kinetics within the oxide. Early studies attempted ...
The passive film is a key protective barrier that suppresses localized corrosion of metals, and its stability is governed by charge transport characteristics, structural composition, and point defect kinetics within the oxide. Early studies attempted to explain passivation based on oxide film theory and adsorption-based mechanisms; however, these approaches were insufficient to provide a comprehensive understanding of long-term film stability. To address these limitations, the Point Defect Model (PDM) and the Bipolar model have been proposed, but each has inherent constraints in either quantitative or structural interpretation. In particular, a unified understanding linking the effects of alloy composition and corrosion environments to the electrical and semiconductive properties of passive films and ultimately to corrosion resistance has not been fully established. In this study, the influence of alloying elements (Cr, Mo, and W), pitting resistance equivalent (PRE) number, and corrosion environment (pH) on the semiconductive characteristics and structural stability of passive films formed on stainless steels was systematically investigated, with the goal of proposing a new interpretive framework for passive film reinforcement. First, the passive films formed on ferritic stainless steels with varying Cr, Mo, and W contents were quantitatively analyzed, and a new parameter, the Bipolar index, was introduced based on the slopes of p-type and n-type semiconductor behavior. Second, the Bipolar index was expanded and applied to austenitic stainless steels with different PRE values, revealing that an increase in PRE enhances p-type characteristics attributable to Cr oxides in the inner layer, along with the development of n-type characteristics associated with Mo-containing oxides in the outer layer. This result demonstrates that the Bipolar index reflects the electrochemical driving force governing passive film formation and stabilization. Third, the electrochemical behavior of passive films formed on a representative super austenitic stainless steel, SR-50A, was examined under acidic and alkaline conditions. The results confirmed that corrosion resistance is maximized when the p-type and n-type semiconductive properties of the inner and outer layers, respectively, are balanced within a specific range, indicating the existence of an optimal electronic configuration for passive film stability. Lastly, dynamic environmental transition tests experimentally demonstrated that passive films are not static layers but dynamically reconstructed structures that adapt to external corrosion environments. This study clarifies the correlation between the structural and electronic characteristics of passive films and proposes a new evaluation basis for predicting corrosion resistance in stainless steels, providing both academic significance and practical implications for alloy design and passivation strategies. Keywords: Stainless steel, Passive film, Semiconductive properties, Point defect model, Bipolar model, Mott-Schottky, XPS, Difference in semiconductive tendencies, Bipolar index