The silicon bridge, a 2.5D packaging technology, currently implements interconnections through Micro Bump bonding. This study investigated the impact of pad size, wiring structure, length, and material on signal transmission characteristics when apply...
The silicon bridge, a 2.5D packaging technology, currently implements interconnections through Micro Bump bonding. This study investigated the impact of pad size, wiring structure, length, and material on signal transmission characteristics when applying hybrid bonding to the silicon bridge to achieve 3.5D packaging technology. Based on the Bump Map pad structure specified in the UCIe Standard, the channel wiring was designed with Curved and Straight routing structures, and the pad size was swept across diameters of 25, 20, 12.5, 5, and 2 μm. For pads with a diameter of 25 μm, the pad material was limited to Sn-Ag Micro Bump, and the channel length was set to 5 mm to verify signal integrity (SI) according to the UCIe Standard SI specifications. The findings demonstrate that satisfying all conditions of the UCIe Standard inherently requires misalignment between the pad regions of chips. If misalignment is not permitted, a Curved routing structure must be used for the bridge wiring. Furthermore, under the condition of identical width and spacing of the bridge wiring, a maximum of 1.7 μm was feasible, highlighting the need for further development to improve crosstalk performance. This study confirms that when establishing chiplet interface standards based on the UCIe Standard, additional structural conditions for the interconnection map or considerations of signal integrity during map design must be incorporated.